Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM
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This is an audio summary of an article by Andreas Beyer, Manveer Singh Munde, Saleh Firoozabadi, Damien Heimes, Tim Grieb, Andreas Rosenauer, Knut Müller-Caspary, and Kerstin Volz published in Nano Lett. 2021, 21, 2018−2025, https://dx.doi.org/10.1021/acs.nanolett.0c04544
It is published under CC BY-NC-ND 4.0 https://creativecommons.org/licenses/by-nc-nd/4.0/
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